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Synchrotron and Laboratory Studies Utilizing a New Powder Diffraction Technique

  • G. S. Knapp (a1), M. A. Beno (a1), G. Jennings (a1), M. Engbretson (a1) and M. Ramanathan (a1)...

Abstract

We have developed a new type of powder diffractometer. The diffractometer has the potential of both high count rates and very high resolution when used at a synchrotron source. The laboratory based instrument can achieve an order of magnitude improvement in count rate over existing methods with proper optics. The method uses a focusing diffracted beam monochromator in combination with a multichannel detector. The incident x-rays fall on a flat plate or capillary sample and are intercepted by a bent focusing monochromator which has the focus of the bend at the sample surface. The powder diffraction lines emerging from the bent crystal monochromator are detected by a linear or 2-dimensional detector. This allows us to eliminate the background from fluorescence or other scattering and to take data over a range of 3° to 4° instead of one angle at a time thereby providing a large improvement over conventional diffractometers.

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4.An example of this type of detector is the Inel CPS 120 System, detector is marketed by Intel Buc France.
5. Knapp, G. S. and Beno, M. A., U. S. Patent Application Serial No. 07/811,060, Filed December 19, 1991.
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8.We use a Bragg-Brentano type diffractometer marketed by Rigaku USA, Inc. Danvers MA, USA.
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10.GSAS, General Structure Analysis System, A. C. Larson and R. B. Von Dreele, LAUR 86-748, (1990).
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