1.
Parrish, W., “Results of the I.U.Cr. Precision Lattice Parameter Project”, ActaCryst.
13, 838–850 (1960).
2.
Vassamillet, L. F. and King, H. W., “Precision X-Ray Diffractometry Using Powder Specimens”, in Mueller, W. M. and M. Fay (Eds.) Advances in X-Ray Analysis, Vol. 6 p. 142–157, Plenum Press (1963).
3.
Boom, G., “Accurate Lattice Parameters and the LPC Method”, Thesis, University of Groningen (1966).
4.
Bond, W. L., “Precision Lattice Constant Determination”, Acta Cryst.
13, p. 814–818 (1960).
5.
Beu, K. E., Musil, F. J. and Whitney, D. E., “Precise and Accurate Lattice parameters by Film Powder Methods. I. The Likelihood Ratio Method”, ActaCryst.
15, p. 1292–1301 (1962).
6.
Beu, K. E., “Further Developments in a Likelihood Ratio Method for the Precise and Accurate Determination of Lattice Parameters”, ActaCryst.
22, p. 932–933 (1967).
7.
Barns, R. L., “A Survey of Precision Lattice Parameter Measurements as a Tool for the Characterization of Single-Crystal Materials”, Mat. Res. Bull.
2, p. 273–282 (1967).
8.
Bearden, J. A., “X-Ray Wavelengths”, p. 10, U.S. Atomic Energy Comm. (1964).
9.
Deslattes, R. D., “Optical and X-Ray Interferometry of a Silicon Lattice Spacing”, App. Phys. Lett.
15, p. 386–388 (1969).
10.
Baker, T. W., George, J. D., Bellamy, B. A. and Causer, R., “Fully Automated High Precision X-Ray Diffraction”,, in Newkirk, J. B., Mallett, G. R. and Pfeiffer, H. G. (Eds.), Advances in X-Ray Analysis, Vol. 11, p. 359–375 (1968).
11.
Lisiovan, V. I. and Dikovskaya, R. R., “Local Precision Determination of Lattice Constants of a Single Crystal”, Instruments and Exper. Tech. (Eng. transl.), 4, p. 992–994 (1969).
12.
Henins, I. and Bearden, J. A., “Silicon-Crystal Determination of the Absolute Scale of X-Ray Wavelengths”, Phys. Rev, 135, p. A890–A898 (1964).
13.
Deslattes, R. D., Peiser, H. S., Bearden, J. A. and Thomsen, J. S., “Potential Appl. of the X-Ray/Density Method for Comparison of Atomic-Weight Values”, Metrologia, 2, p. 104–111 (1966).
14.
Segmuller, A., “Automated Lattice Parameter Determination on Single Crystals”, in Henke, B. L., Newkirk, J. B. and Mallett, G. R. (Eds.), Advances in X-Ray Analysis, Vol. 13, p. 455–467 (1970).
15.
Thomsen, J. S. and Yap, F. Y., “Effect of Statistical Counting Errors on Wavelength Criteria for X-Kay Spectra”, J. of Research, NBS-A.
72A, p. 187–205 (1968).
16.
Backovsky, J., “On the Most Accurate Measurements of the Wavelengths of X-Ray Spectral Lines”, Czech. J. Phys.
15, p. 752–759 (1965).
17.
Donnay, G. and Donnay, J. D. H., “The Symmetry Change in the High-Temperature Alkali Feldspar Series”, Am. J. Science, Bowen Vol. (Pt. 1), p. 115–132 (1952).
18.
Burke, J. and Tomkeieff, M. V., “Specimen and Beam Tilt Errors in Bond's Method of Lattice Parameter Determination”, Acta Cryst.
A24, p. 683–685 (1968).
19.
Burke, J. and Tomkeieff, M. V., “Errors in the Bond Method of Lattice Parameter Determinations - Further Considerations”, J. Appl.Cryst.
2, p. 247–248 (1969).
20.
Gruber, S. E. and Black, E. E., “Analysis of the Axial Misalignment Error in Precision Lattice Parameter Measurement by the Bond Technique”, J. Appl, Cryst.
3, p. 354–357 (1970).
21.
G, M. A..Halliwell, “Measurement of Specimen Tilt and Beam Tilt in the Bond Method”, J. Appl. Cryst.
3, p. 418–419 (1970).
22.
Mandel, J., “The Statistical Analysis of Experimental Data”, p. 1ll, Interseience Publ., John Wiley and Sons, New York, 1964.
