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Some Observations on X-Ray Emission as a Function of Accelerating Voltage in the Microprobe
Published online by Cambridge University Press: 06 March 2019
Abstract
Data are presented from several systems for which the emitted X-ray intensity goes through a maximum as accelerating voltage is increased. An attempt is made to systematize the data in terms of absorption, wavelength, and atomic number. A very simple model, analyzed graphically, is capable of displaying many of the features of the experimental data.
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- Copyright © International Centre for Diffraction Data 1964