Hostname: page-component-7bb8b95d7b-nptnm Total loading time: 0 Render date: 2024-09-24T23:35:10.414Z Has data issue: false hasContentIssue false

Some Elemental Determinations of Catalytic Materials Using a Thin-Film Internal Standard Technique by Radioisotope Excited X-Ray Fluorescence*

Published online by Cambridge University Press:  06 March 2019

W. C. Parker
Affiliation:
Instituto Venezolano de Investigaciones Científicas-IVIC, Apartado 1827 Caracas 1010-A, Venezuela
J. J. LaBrecque
Affiliation:
Instituto Venezolano de Investigaciones Científicas-IVIC, Apartado 1827 Caracas 1010-A, Venezuela
Get access

Extract

Applications of some selected elemental determinations of different catalytic materials by radioisotope excited x-ray fluorescence will be presented. The analytical method, an improved sample preparation and analysis technique were presented at the last Denver Conference (1). Data on the accuracy and precision of each of the following types of catalysts are presented. 1) Platinum catalysts (0.5 - 10% Pt) on alumina and carbon supports used for dehydrogenation, hydrohalogenation, oxidation processes, etc. 2) Palladium catalysts (0.5% - 10% Pt) on alumina and carbon supports employed for alkylation, decarbonisation, hydrogenation, etc.

Type
IV. XRF Applications : Metals, Catalysts, Oils
Copyright
Copyright © International Centre for Diffraction Data 1981

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

This work was funded in part by CONICIT (Venezuela; Sl-1149) which form part of an international project with the NSF (USA).

References

1. LaBrecque, J.J., “An improved sample preparation and analysis technique for the determination of minor elements in catalytic materials by radioisotope induced X-ray fluorescence”, Adv. X-ray Analysis, 24 (1980).Google Scholar
2. Bertin, E.P., “Principles and practices of X-ray spectrometric analysis”, Plenum Press, New York (1975).Google Scholar
3. Kalman, S., Talanta 23, 579 (1976), p. 494500.Google Scholar
4. Beamish, F.E., Lewis, C.L. and Van Loon, J.C., Talanta, 16, 1 (1969).Google Scholar
5. LaBrecque, J.J., Proceedings of the 3rd. International Conference on Computers in Chemical Research, Education and Technology, Caracas, Venezuela p. 6681 (1976).Google Scholar
6. LaBrecque, J.J., J. Radioanal. Chem., 127 (1977).Google Scholar