Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-25T04:37:26.805Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative X-Ray Diffraction Analysis of Smectites: II -- Reference Intensity Ratio Calculations for Smectite Analysis

Published online by Cambridge University Press:  06 March 2019

Hong Chen  and
Briant L. Davis
Hong Chen
Affiliation:
Engineering and Mining Experiment Station (EMES) South Dakota School of Mines and Technology Rapid City, South Dakota 57701-3995
Briant L. Davis
Affiliation:
Engineering and Mining Experiment Station (EMES) South Dakota School of Mines and Technology Rapid City, South Dakota 57701-3995
Get access

Extract

In quantitative x-ray diffraction (XRD) analysis, the reference intensity ratio (ki or RIR) is one of the most important parameters of the reference intensity method (RIM). The ki is a function of the intensity of x-ray reflection and the mass attenuation coefficient of the sample for the “Lki” method (Davis, 1992). The intensities for 00l reflections have been calculated, and also the reference intensity ratios corresponding to the 001 reflection have been estimated in this part of the work, which is very important for investigating the iron influence on the XRD analysis of smectites. The Reynolds’ proposed glycol-expanded montmorillonite structure was used as a basis for the calculations.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 599 - 606
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Chung, F. H., 1974a, Quantitative interpretation of x-ray diffraction patterns of mixtures. I. Matrix-flushing method for quantitative multicomponent analysis. J. Appl. Cryst., 7, 519–515Google Scholar
Chung, F. H., 1974b, Quantitative interpretation of x-ray diffraction patterns of mixtures. II. Adiabatic principle of x-ray diffraction analysis of mixtures. J. Appl. cryst., 7, 526–531 Google Scholar
Chung, F. H., 1975, Quantitative interpretation of x-ray diffraction patterns of mixtures. III. Simultaneous determination of a set of reference intensities. J. Appl. Cryst., 8, 17–19 Google Scholar
Davis, B. L., 1992, Quantitative phase analysis with reference intensity ratios, National Institute of Standards and Technology Special Publication 846. Proceedings of the International Conference Accuracy in Powder Diffraction II, held at NIST, Gaithersburg, Md, , May 26 -29, 7pp.Google Scholar
Reynolds, R.C 1965, An x-ray study of ethylene glycol-montmorillonite complex, The American Mineralogist, 50, 990–1001 pp.Google Scholar