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Quantitative Analysis of Odd-Shaped Samples by X-Ray Fluorescence Spectrometry Using Intensity Ratios

  • G. Platbrood (a1) and H. Van De Velde (a1)

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In industrial laboratories, a great diversity of samples is usually presented for analysis (alloys, powders, solutions, …). Fast results are invariably required so that methods with minimal preparation times have to be developed. This paper discusses a method for quantitative analysis of metallic samples in the form of clippings or odd-shaped fragments where the specimen surface does not cover the total surface of the sample holder. In some laboratories it is common practice to use sample holders with a small orifice to analyse sample fragments, but this method strongly reduces the fluorescent intensities. We have the feeling that a method that uses the whole surface of the specimen should be much welcomed.

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[1] Wybenga, F.T., “X-ray spectrometry”, 8, 102-103 (1979).
[2] Berger, P., etal., “Analysis”, 9, 272-275 (1981).
[3] Tao, G.Y., Pella, P.A., Rousseau, R.M., “NSS. echnical note 1213” (1985).
[4] Vrebos, B.A.R., Helsen, J.A., “Adv. x-ray Analysis”, 28, 31 (1985).
[5] Criss, J.W., “NRLXRF. Aortran Program for X-Ray Fluorescence Analysis” COSMIC. 0D-00065 (1977).

Quantitative Analysis of Odd-Shaped Samples by X-Ray Fluorescence Spectrometry Using Intensity Ratios

  • G. Platbrood (a1) and H. Van De Velde (a1)

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