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Precision Lattice-Parameter Determination by Double-Scanning Diffractometry
Published online by Cambridge University Press: 06 March 2019
Abstract
The availability of counter-tube diffractometers which can scan both sides of the direct beam makes it possible to locate the zero-angle position by comparing peak positions measured on either side of the beam. These diffractometers may thus be used to determine accurate lattice parameters without the need of a calibrating substance. The feasibility of this method is explored by determining the lattice parameters of pure silver, and the limits of accuracy are discussed.
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- Research Article
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- Copyright © International Centre for Diffraction Data 1961
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