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A Position-Sensitive Proportinal Counter for Residual Stress Measurement by means of Microbeam X-Rays
Published online by Cambridge University Press: 06 March 2019
Abstract
A position-sensitive proportional counter (PSPC) with high counting efficiency has been made for stress analysis with low intensity X-rays such as microbeam X-rays.
This PSPC system has made it possible to measure the residual stress in a small region such as a fatigue crack tip in very short time compared with the measurement by standard diffractometer or film methods.
- Type
- X-Ray Diffraction Stress (Strain) Determination
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1979
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