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On-Stream Analysis of Float Process Slurries by XRF

Published online by Cambridge University Press:  06 March 2019

J. Ereiser ,
G. Frank ,
J.W. Guy  and
D. Litchinsky
J. Ereiser
Affiliation:
Bondar-Clegg & Co. Ltd., 6 Bexley Place, Ottawa, Ontario, Canada
G. Frank
Affiliation:
Bondar-Clegg & Co. Ltd., 6 Bexley Place, Ottawa, Ontario, Canada
J.W. Guy
Affiliation:
Bondar-Clegg & Co. Ltd., 6 Bexley Place, Ottawa, Ontario, Canada
D. Litchinsky
Affiliation:
Bondar-Clegg & Co. Ltd., 6 Bexley Place, Ottawa, Ontario, Canada
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Abstract

An on-stream XRF analysis system for monitoring the concentrations of the elements in float process slurries is described. The system consists of multiple XRF stations monitored by a central computer. The stations utilize high resolution Si(Li) detectors and radioisotope x-ray sources for stability and for good separation of adjacent elements such as Cu and Zn. Results obtained from an on-stream slurry analysis of Copper and Lead Tails and Copper and Lead Concentrates are presented and these are compared to assay lab results.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 297 - 302
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

1. Watt, J.S. “Nuclear Techniques for On-Line Measurement in the Control of Mineral Processing”; IAEA Int. Symp on Nuclear Techniques, Exploration, Extraction and Processing of Mineral Resources; IAEA-SM-216-103; 569–602 (1977).Google Scholar
2. Cooper, H.R. and Vaugh, R.L. “Computer Automated X-Ray Fluorescence Assaying”; TRANS SME/AIME; 224:295–301 (1969).Google Scholar