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Numerical Resolution Enhancement of X-ray Diffraction Patterns

Published online by Cambridge University Press:  06 March 2019

Katsumi Ohno ,
Hiroshi Harada ,
Toshihiro Yamagata  and
Michio Yamazaki
Katsumi Ohno
Affiliation:
National Research Institute for Metals 2-3-12 Nakameguro, Meguro-ku, Tokyo 153, Japan
Hiroshi Harada
Affiliation:
National Research Institute for Metals 2-3-12 Nakameguro, Meguro-ku, Tokyo 153, Japan
Toshihiro Yamagata
Affiliation:
National Research Institute for Metals 2-3-12 Nakameguro, Meguro-ku, Tokyo 153, Japan
Michio Yamazaki
Affiliation:
National Research Institute for Metals 2-3-12 Nakameguro, Meguro-ku, Tokyo 153, Japan
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Abstract

A numerical resolution-enhancement method was developed for x-ray diffraction data measured with a conventional x-ray diffractometer. This method removes the instrumental broadening due to x-ray optics, including the spectral distribution of the x-ray source such as the CuKα doublet. The advantages of this method are to separate the cluster of peaks in x-ray powder patterns into individual peaks without previous knowledge of the number of peaks, and to remove CuKα2 reflection peaks automatically.

The instrumental window function, which was approximated by a modified pseudo-Voigt function, was calculated from the measured diffraction pattern of NBS Standard Reference Materials (640B) by a non-linear least squares method. The simple diffraction patterns, including no CuKα2 peaks, were obtained from the diffraction patterns measured with the conventional x-ray diffractometer by using the window function mentioned above.

The application of the method of determination of the lattice misfit between γ and γ phases in Ni-base superalloys was also described.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 409 - 416
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

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