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Norelco Pinhole Attachment

Published online by Cambridge University Press:  06 March 2019

D.C. Miller
D.C. Miller*
Affiliation:
Philips Electronic Instruments, Mount Vernon, New York
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Abstract

An adapter for a standard Norelco spectrographte attachment will be described which permits the examination of a selected area of the specimen by X-ray fluorescence analysis. The size of the area can be varied depending upon the choice of pinholes with sizes available dovwi to 0.010 in. or 250μ. The sample is placed into a specially modified sample holder so that it can be moved at orthogonal directions under the beam from outside the spectrograph while the sample is under X-ray irradiation. Dam on applications will also be given.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 4: Ninth Annual Conference on Applications of X-ray Analysis, August 10-12, 1960 , 1960 , pp. 513 - 520
Copyright
Copyright © International Centre for Diffraction Data 1960

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