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New Directions in the X-Ray Diffraction Analysis of Organic Materials

Published online by Cambridge University Press:  06 March 2019

Ron Jenkins*
Affiliation:
International Centre for Diffraction Data Swarthmore, PA, USA
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Abstract

The analysis of crystalline organic phases by X-ray powder diffraction presents special problems, beyond those typically associated with inorganic materials. The large unit cells often associated with organic compounds, combined with the low symmetry of the structures, give rather complicated diffraction patterns which contain many low angle lines. The Bragg-Brentano geometric arrangement employed in most commercial diffractometers gives maximum d-spacing error at low diffraction angles. This, in turn, means that not only can the large d-spacing data be of poor quality, but also that much of the low angle data required for the indexing of the pattern is subject to large errors.

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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