Hostname: page-component-8448b6f56d-wq2xx Total loading time: 0 Render date: 2024-04-19T13:19:15.438Z Has data issue: false hasContentIssue false
  • English
  • Français

Multistep Intensity Indication in Scanning Microanalysis

Published online by Cambridge University Press:  06 March 2019

Teruichi Tomura ,
Hiroshi Okano ,
Koichi Hara  and
Tadao Watanabe
Teruichi Tomura
Affiliation:
Hitachi Central Research Laboratory Kokubunji, Tokyo, Japan
Hiroshi Okano
Affiliation:
Hitachi Central Research Laboratory Kokubunji, Tokyo, Japan
Koichi Hara
Affiliation:
Hitachi, Limited, Naka Works Katsula-shi, Ibaragi, Japan
Tadao Watanabe
Affiliation:
Hitachi, Limited, Naka Works Katsula-shi, Ibaragi, Japan
Get access

Abstract

Improvements on the semiquantitative analysis in a scanning electron-probe microanalysis will be discussed. Improvements have been attained by the development of a new content mapping attachment. By using this attachment, the X-ray intensity is indicated on a cathode-ray tube in nine steps of brightness. A discrimination operation on the intensity information can be done to help the observation of fine concentration variation in the specimen. The scanning image about an element in the specimen is displayed on the screen of the cathode-ray tube or on a paper tape by a typeout recording. The image is composed of 2500 picture elements. The brightness of each picture clement corresponds to an exponentially modulated X-ray intensity emitted from the corresponding point of the specimen surface. The correct information about the X-ray intensity to the observer is given by using this kind of modulation. In the image display on typewritten paper, the X-ray intensity is indicated with numbets from 0 to 9 according to the intensity grade. Each number is printed with an individual color to present a contour map of the element distribution. The time necessary to obtain one complete contour map is about 8.5 min.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 11: Sixteenth Annual Conference on Applications of X-ray Analysis, August 9-11, 1967 , 1967 , pp. 316 - 325
Copyright
Copyright © International Centre for Diffraction Data 1967

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hcinrich, K. F. J., “Oscilloscope Readout of Electron Microprobe Data,” in: W. M. Mueller and M. J. Fay (eds,), Advances in X-Ray Analysis, Vol. 6, Plenum Press, New York, 1963, p. 291.Google Scholar
2. Melford, D. A., “The Use of Electron Probe. Microanalysis in Phvsical Metallurgy,” J. Inst. Metals 90: 217, 1962.Google Scholar
3. Birks, L. S. and Batt, A. P.,“Use of a Multichannel Analyzer for Electron Probe Microanalysis,” Anal. Chem, 35: 778, 1963.Google Scholar