In the EDXRF analysis of minor and trace elements in a variety of matrices, the use of a polarized x-ray source incident on a sample will provide minimum detection limits three to five times lower than the use of non-polarized sources (1,2). There are various methods of producing monochromatic polarized x-rays for specimen excitation (3,4,5,6 ). Such x-ray sources may produce the lowest detection limits for a single element or a narrow range of elements. However, if one is interested in simultaneously analyzing a broad range of elements, a polychromatic source is desired (7,8,9). We present here a new method for producing broad-band polarized x-rays.