Due to unplanned maintenance of the back-end systems supporting article purchase on Cambridge Core, we have taken the decision to temporarily suspend article purchase for the foreseeable future. We apologise for any inconvenience caused whilst we work with the relevant teams to restore this service.
The design of an x-ray detector suitable for use in tomography must be optimized for the intended application. Recently, we have developed microtomography applications that require resolution of -1 micron in three spatial dimensions and -1% statistical accuracy in the reconstruction of attenuation coefficients for each cubic micron volume element in a .1 cubic mm specimen. X-ray detector design for these applications must take into account much more than just the demanding micron spatial resolution requirement. The detector must be optimized to take into account the physical properties of the specimen to be measured, the characteristics of the x-ray beam available to probe the specimen, signal to noise ratios needed in the reconstructed image and requirements of the data processing algorithm. In addition, the detector design should be sufficiently flexible to allow significant variation in the kinds of specimens that can be examined.