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Measuring Residual and Applied Stress using X-Ray Diffraction on Materials with Preferred Orientation and Large Grain Size

Published online by Cambridge University Press:  06 March 2019

James Pineault  and
Michael Brauss
James Pineault
Affiliation:
Proto Manufacturing Ltd., Oldcastle, Ontario
Michael Brauss
Affiliation:
Proto Manufacturing Ltd., Oldcastle, Ontario
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Abstract

One of the most difficult tasks in applied and residual stress measurement of polycrystalline materials using x-ray diffraction is dealing with preferred orientation and large grain size.

A common solution to large grain size problems has been to choose a larger aperture, but in certain cases this is undesirable and/or impossible. When preferred orientation has been identified as the problem, the common approach has been to choose another diffraction plane or oscillate the x-ray diffraction head during data collection. Remedies such as these can distort the peak breadth and are often not sufficient to totally negate the grain size and preferred orientation effects.

A technique described as the “step scan with virtual window” has been developed jointly at MTL (formerly Canmet) and Proto Mfg. Ltd. to deal specifically with the aforementioned effects of grain size and preferred orientation.

This paper highlights some of the problems that arise in stress analysis of materials exhibiting preferred orientation and large grain size. Subsequently a comparison of the results obtained using standard diffraction technique, oscillation and the “step scan with virtual window” is made.

Type
IX. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 585 - 593
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

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