Hostname: page-component-8448b6f56d-sxzjt Total loading time: 0 Render date: 2024-04-24T23:49:11.067Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ Crystallization Measurements on Fe-Zr Glasses Using an Automated High-Temperature Diffractometer with a Position Sensitive Detector

Published online by Cambridge University Press:  06 March 2019

G. Zorn ,
E. Hellstern ,
H. Göbel  and
L. Schultz
G. Zorn
Affiliation:
Siemens AG, Research Laboratories, Munich
E. Hellstern
Affiliation:
Siemens AG, Research Laboratories, Erlangen, West Germany
H. Göbel
Affiliation:
Siemens AG, Research Laboratories, Munich
L. Schultz
Affiliation:
Siemens AG, Research Laboratories, Erlangen, West Germany
Get access

Extract

Metallic glasses are mostly produced by fast quenching from a melt. The glass forming composition range in binary materials is thereby restricted to the area around eutectics. The production of metal-metal binary glasses in a much wider composition range is possible by employing a technique called 'mechanical alloying'. Using this technique the metallic class is produced as a powder which can be manufactured into any shape to make use of the properties the material exhibits in the amorphous state. During compacting, and also in some applications of the finished product, the glass has to endure elevated temperatures which might cause devitrification. Since this crystallization of a metallic glass usually results in the loss of properties essential for a certain application it is necessary to investigate this crystallization behaviour and thus receive information about a material's prospective performance in a particular application.

Type
IX. High Temperature and Non-Ambient Powder Diffraction Applications
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 483 - 491
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hellstern, E., Schultz, L.; Appl. Phys. Lett., 48, 124, (1986);Google Scholar
2. Hellstern, E., Schultz, L.; Appl.Phys.Lett., 49, (1986);Google Scholar
3. Göbel, H.; Adv. in X-Ray Anal., 24, 187, (1982);Google Scholar
4. Hellstern, E., L.Schultz; Proc. 6th Int.Conf.of Liquid and Amorphous Metals, Garmisch Partenkirchen, (1986), in print; 5. Malakhova, T.O., Alekseyeva, Z.M. ; J.Less Common Met., 81, 293, (1981);Google Scholar
6. Fujinami, M., Ujihira, Y. ; J. Appl. Phys., 59, 2387, (1986) ;Google Scholar
7. Luborsky, F.E. ; Proc.Rapidly Quenched Metals 5, editors : Steeb, S., Warlimont, H., published by North Holland Phys.Pub., Amsterdam 1986, 357;Google Scholar
8. Boswell, P.G.; J. Thermal Anslyt., 18, 353, (1980) ;Google Scholar
9. Altounian, Z., Volkert, C.A., Strom-Olsen, J.O.; J. Appl.Phys., 57, 1777, (1985) ;6. M.Fujinami, Luborsky, Y.F.E.;Google Scholar