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IEE - A New Type of X-Ray Photoelectron Spectrometer
Published online by Cambridge University Press: 06 March 2019
Abstract
A new type of x-ray photoelectron spectrometer has been designed. Although smaller in size, the new instrument shows a considerable improvement in sensitivity compared to other photoelectron spectrometers. This has been achieved through the provision of several new features: The photoelectrons are retarded to low energy (10 eV through 100 eV) before entering the deflecting energy analyzer. A spherical electrostatic analyzer in figure of rotation is used. Annular slits at both source and detector provide a large effective source area. The instrument is shielded against external magnetic fields (earth magnetic field and a.c. fields) by a double layer of mu-metal, thus avoiding the installation of large Helmholtz coils.
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- Copyright © International Centre for Diffraction Data 1969