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Formalism for the Evaluation of Pseudo-Macro Stress Fields σ33(z) from Q-AND ψ-Mode Diffraction Experiments Performed with Synchrotron Radiation
Published online by Cambridge University Press: 06 March 2019
Abstract
A self-consistent scheme is proposed for the evaluation of stressfields which vary strongly within the penetration depth of the X-rays in polycrystalline specimens which are elastically isotropic and homogeneous on a macroscopic scale. Very precise diffraction experiments have to be performed for practical applications.
- Type
- VII. Stress Determination by Diffraction Methods
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- Copyright © International Centre for Diffraction Data 1991
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