Hostname: page-component-77c89778f8-swr86 Total loading time: 0 Render date: 2024-07-18T20:03:59.406Z Has data issue: false hasContentIssue false

A Focusing System for X-ray Diffraction Studies of Materials Under High Pressure in the Diamond Cell

Published online by Cambridge University Press:  06 March 2019

Y. Wu
Affiliation:
Lawrence Berkeley Laboratory Berkeley, CA 94720
A. C. Thompson
Affiliation:
Lawrence Berkeley Laboratory Berkeley, CA 94720
J. H. Underwood
Affiliation:
Lawrence Berkeley Laboratory Berkeley, CA 94720
H. K. Mao
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
Y. W. Fei
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
J. Z. Hu
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
J. V. Badding
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
J. F. Shu
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
Get access

Extract

Recent advances in techniques to generate static ultra-high pressure (>100 GPa) in the diamond anvil cell have significantly enhanced our understanding of the properties of solids under these extreme conditions. In order to characterize the structure of solids at these pressures, X-ray diffraction using synchrotron radiation has become an invaluable tool. Since the highest pressures are attained at the expense of sample volume (~ 100 μm3) , it is best to use the intense radiation available from a synchrotron to study the very small samples used in ultra-high pressure studies. Even with the intense x-ray beams currently available, it is still often desirable to focus the x-ray beam to increase the available flux. We have developed a focusing system which uses multilayer coated spherical mirrors. With this system, intense x-ray beams with sizes smaller than 10 μm by 10 μm can be achieved at a synchrotron radiation beamline. Previously, we used the focusing system for x-ray microprobe experiments.

Type
IX. Nonambient Application of Diffraction
Copyright
Copyright © International Centre for Diffraction Data 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Thompson, A. C., Underwood, J. H., Wu, Y., Giauque, R. D., Jones, K. W. and Rivers, M. L., Elemental Measurements With an X-Ray Microprobe of Biological and Geological Samples With Femtogram Sensitivity, Nucl. Instr. and Meth. A226: 318 (1987).Google Scholar
2. Underwood, J. H., Thompson, A. C., Wu, Y. and Giauque, R. D., X-Ray Microprobe Using Multilayer Mirrors, Nucl. Instr. and Meth. A 226: 296 (1987).Google Scholar
3. Wu, Y., Thompson, A. C., Underwood, J. H., Giauque, R. D., Rivers, M. L., and Jones, K. W., A tunable synchrotron x-ray microprobe, Nucl. Instr. and Meth. A291;146(1990) .Google Scholar
4. Xu, J. A., Mao, H. K. and Bell, P. M., High-Pressure Ruby and Diamond Fluorescence: Observations at 0.21 to 0.55 Terapascal, Science. 232:1404, (1986); William G. Moss, John O. Hallquist, Robin Reichlin, Kenneth A. Goettel and Sue Martin, Finite element analysis of the diamond anvil cell: Achieving 4,6 Mbar, Appl. Phys. Lett. 48:1258. (1986).Google Scholar
5. SSRL user guide, Oct. 1988.Google Scholar
6. Amemiya, Y., Synchrotron Radiation News. 3:21, (1990). For a description of Molecular Dynamics’ imaging plate reader, see R. F. Johnston, S. C. Pickett, D. L. Barker, Autoradiography using storage phosphor technology, Electrophoresis, 11: 355 (1990).Google Scholar
7. Mao, H. K., Wu, Y., Shu, J. F., Chen, L. C., and Jephcoat, A. P., Static compression of iron to 300 GPa and Fe0.8Ni0.2 to 260 GPa: implications for the composition of the core, J. Geophys. Res., submitted for publication.Google Scholar
8. Mao, H. K., Wu, Y., Hemley, R. J., Chen, L. C., Su, J. F., and Finger, L. W., X-ray diffraction to 302 GPa: the crystal structure of CsI at high pressure, Science, 246: 649 (1989); H. K. Mao, Y. Wu, R. J. Hemley, L. C. Chen, J. F. Shu, L. W. Finger, and D. E. Cox, High-pressure phase transition and equation of state of CsI, Phys. Rev. Lett. 64: 1749 (1990).Google Scholar
9. Aleksandrov, I. V., Goncharov, A. F., Makarenko, I. W. and Stishov, S. M., New data on the equation of state and the phase transitions in cesium iodide, preprint.Google Scholar
10. Wu, Y. et al., to be published.Google Scholar