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Energy Dispersive X-ray Diffractometry
Published online by Cambridge University Press: 06 March 2019
Abstract
This paper describes the principles, methods, instrumentation and results of EDXKD and a computer method of profile fitting to obtain corrected intensities and peak energies from isolated and overlapping reflections. The profile, P, of a diffraction peak is a convolution of the incident X-ray spectrum, X, the geometrical aberrations, T, the contribution from the specimen, S, and the detector resolution function, D.
- Type
- X-Ray Powder Diffraction
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1976
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