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Electron-Probe X-Ray Spectrograph: Design, Evaluation, and Application

  • J. D. Brown (a1), J. W. Thatcher (a1) and W. J. Campbell (a1)

Abstract

The Bureau of Mines purchased the electron optics, vacuum system, and sample stage assembly for the electron-probe X-ray spectrograph and designed and built the two reflection and two transmission scanning curved-crystal spectrometers. The reflection spectrometers were placed in a vacuum chamber for measurements of long-wavelength X-radiation. Operational characteristics of this spectrograph were determined. A low-alloy stainless-steel sample containing 5 wt. % depleted uranium and a stainless-steel sample containing 20 wt. % gadolinium were analyzed.

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References

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1. Thatcher, J. W. and Campbell, W. J., “ Fluorescent X-R ay Spectrographie Probe-De sign and Application,” U.S. Bur, Mines Rept. Invest, 5500, 1959, 23 pp.
2. DuMond, J. W. M., “Crystal Diffraction Spectroscopy of Nuclear X-Rays,* in K. Siegbahn (éd.), Beta- and Gamma-Ray Spectroscopy, North-Holland Publishing Co., Amsterdam, 1955, p. 100.
3. Birks, L. S. and Brooks, E. J., “Uniform Plastic Bending of Crystals for Focusing X-Ray Radiation,” Rev. Sci. Instr., Vol. 24, 1953, p. 992.
4. Kemp, J. W. and Andertnann, G., “Cylindrical Crystal X-Ray Optics,” 5th Annual Corf, on Industrial Applications of X-Ray Analysis, Denver Research Institute, Denver, Colo., August 1956.

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