Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-25T16:17:07.352Z Has data issue: false hasContentIssue false

Determination of Lattice Constants of Polycrystalline (Monoclinic) Uranium Tetrafluoride*

Published online by Cambridge University Press:  06 March 2019

Peter R. Morris
Affiliation:
National Lead Company of Ohio Cincinnati, Ohio
Vernon Morton
Affiliation:
National Lead Company of Ohio Cincinnati, Ohio
Get access

Abstract

A technique is described for determining lattice constants of polycrystalline monoclinic materials and partition of observed experimental error among the several constants. The technique is illustrated for uranium tetrafluoride. Precision of the method is typically ±0.01 to ±0.02 Å on the unit cell lengths, and ±4 to ±8 min on the angle between axes. This is of the order expected, were single-crystal techniques limited to the range of Bragg angles available.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1964

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Zachariasen, W. H., General Physics Report for Period Ending December 25, 1943, USAEC Report CP-1168, p. 12.Google Scholar
2. Burbank, R. D., The Crystal Structure of Uranium Tetrafluoride, USAEC Report AECD-3216, June 6, 1951.Google Scholar
3. Burbank, R. D. and Bensey, F. N. Jr., The Crystal Structure of Zirconium Tetraftuorida, USAEC Report K-1280, October 31, 1956.Google Scholar
4. Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, John Wiley & Sons, Inc., New York, 1954, p. 144.Google Scholar
5. Barrett, C. S., Structure of Metals, Crystallographic Methods, Principles and Data, McGraw-Hill Book Co., Inc., New York, 1943, p. 529.Google Scholar
6. Dauben, C. H. and Templeton, D. H., “A Table of Dispersion Corrections for X-Ray Scattering of Atoms,” Acta Cryst. 8: 841, 1955.Google Scholar
7. Cauchois, Y. and Hulubei, H., Longueurs d'onde des emissions X et des discontinuités d'absorption X, Hermann et Cie, Paris, 1947, plate I.Google Scholar
8. Cohen, M. U., “The Elimination of Systematic Errors in Powder Photographs,” Z. Krist. 94: 288, 1936.Google Scholar
9. Hess, J. B., “A Modification of the Cohen Procedure for Computing Precision Lattice Constants from Powder Data,” Acta Cryst. 4: 209, 1951.Google Scholar
10. Vogel, R. E. and Kempter, C. P., A Mathematical Technique for the Precision Determination of Lattice Constants, USAEC Report LA-2317, April 1959.Google Scholar
11. Mueller, M. H. and Heaton, L., Determination of Lattice Parameters vsitk the Aid of a Computer, USAEC Report ANL-6176, January 1961.Google Scholar
12. Farquhar, M. C. M. and Lipson, H., “The Accurate Determination of Cell Dimensions from Single-Crystal X-Ray Photographs,” Proc. Phys. Soc. (London) 58: 200, 1946.Google Scholar
13. Weisz, O., Cochran, W., and Cole, W. F., “The Accurate Determination of Cell Dimensions from Single-Crystal X-Ray Photographs,” Acta Cryst. 1: 83, 1948.Google Scholar
14. Brownlee, K. A., Statistical Theory and Methodology in Science and Engineering, John Wiley & Sons, Inc., New York, 1960, p. 481.Google Scholar
15. Swanson, H. E., Gilfrich, N. T., and Ugrinic, G. M., “Standard X-Ray Diffraction Powder Patterns,” Natl. Bur. Stds. (U.S.), Circ. 539, 5: 36, 1955, Government Printing Office, Washington, D.C.Google Scholar