1.
Decker, B. F., Asp, E. T. and Harker, D., “Preferred Orientation Determination Using a Geiger Counter X-ray Goniometer,” J. Appl. Phys.
19, 388–392, 1948.
2.
Schulz, L. G., “Determination, of Preferred Orientation in Flat Transmission Samples Using a Geiger Counter X-ray Spectrometer,” J. Appl. Phys.
20, 1033–1036, 1949.
3.
Chernock, W. P. and Beck, P. A., “Analysis of Certain Errors in the X-ray Reflection Method for the Quantitative Determination of Preferred Orientations,” J. Appl. Phys.
23, 341–345, 1952.
4.
Feng, C., “Determination of Relative Intensity in X-ray Reflection Study,” J. Appl. Phys.
36, 3432–3455, 1965.
5.
Aoki, K., Hayami, S. and Matsuo, M., “Improvement of Accuracy in Presentation of Conventional Pole Figures,” Newkirk, J. B. and Mallett, G. R., Editors, Advances in X-ray Analysis, Vol. 10, 342–353, 1966.
6.
Bragg, R. H. and Packer, C. M., “Quantitative Determination of Preferred Orientation,” J. Appl. Phys.
35, 1322–1328, 1964.
7.
Tenckhoff, E., “Defocusing for the Schulz Technique of Determining Preferred Orientation,” J. Appl. Phys.
41, 3944–3948, 1970.
8.
Norton, J. T., “A Technique for Quantitative Determination of Texture of Sheet Metals,” J. Appl. Phys.
19, 1176–1178, 1948.
9.
Field, M. and Merchant, M. E., “Reflection Method of Determining Preferred Orientation on the Geiger Counter Spectrometer,” J. Appl. Phys.
20, 741–744, 1949.
10.
Schulz, L. G., “A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-ray Spectrometer,” J. Appl. Phys.
20, 1030–1033, 1949.
11.
Holland, J. R., Engler, N. and Powers, W., “The Use of Computer Techniques to Plot Pole Figures,” Mueller, W. M., Editor, Advances in X-ray Analysis, Vol. 4, 74–84, 1960.
12.
BecK, P. A. and Hu, H., “The Origin of Recrystallization Texture,” ASM Seminar on Recrystallization, Grain Growth and Textures, October 1965, Cleveland, Ohio, 393–433.
13.
Chao, Hung-Chi, “Direct Printout X-ray Pole Figures from Digital Computers,” Barrett, C. S., Newkirk, J. B. and Mallett, G. R., Editors, Advances in X-ray Analysis, Vol. 12, 391–403, 1968.