Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-23T18:39:56.075Z Has data issue: false hasContentIssue false
  • English
  • Français

A Computerized Technique of Plotting a Complete Pole Figure by an X-Ray Reflection Method

Published online by Cambridge University Press:  06 March 2019

J. J. Klappholz ,
S. Waxman  and
C. Feng
J. J. Klappholz
Affiliation:
Picatinny Arsenal Dover, New Jersey 07801
S. Waxman
Affiliation:
Picatinny Arsenal Dover, New Jersey 07801
C. Feng
Affiliation:
Picatinny Arsenal Dover, New Jersey 07801
Get access

Abstract

The technique of plotting a complete pole figure composed of data points in both longitude and latitude from 0 to 180 degrees by a computer program is described. X-ray data were obtained by a reflection method from a specimen cut into three sections mutually perpendicular to one another. The computer program calculates each position in the pole figure based on the time rate of change of the tilt angle ϕ and the spin angle α which are transformed into rectangular coordinates.

The advantage of the present technique is to minimize the x-ray intensity loss due to geometric defocusing, since each section of a given specimen is required to tilt not more than 55 degrees. Due to the fact that a complete pole figure is plotted, one is allowed to examine the symmetry or lack of symmetry in a given specimen with respect to a set of references axes.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 365 - 372
Copyright
Copyright © International Centre for Diffraction Data 1971

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Decker, B. F., Asp, E. T. and Harker, D., “Preferred Orientation Determination Using a Geiger Counter X-ray Goniometer,” J. Appl. Phys. 19, 388–392, 1948.Google Scholar
2. Schulz, L. G., “Determination, of Preferred Orientation in Flat Transmission Samples Using a Geiger Counter X-ray Spectrometer,” J. Appl. Phys. 20, 1033–1036, 1949.Google Scholar
3. Chernock, W. P. and Beck, P. A., “Analysis of Certain Errors in the X-ray Reflection Method for the Quantitative Determination of Preferred Orientations,” J. Appl. Phys. 23, 341–345, 1952.Google Scholar
4. Feng, C., “Determination of Relative Intensity in X-ray Reflection Study,” J. Appl. Phys. 36, 3432–3455, 1965.Google Scholar
5. Aoki, K., Hayami, S. and Matsuo, M., “Improvement of Accuracy in Presentation of Conventional Pole Figures,” Newkirk, J. B. and Mallett, G. R., Editors, Advances in X-ray Analysis, Vol. 10, 342–353, 1966.Google Scholar
6. Bragg, R. H. and Packer, C. M., “Quantitative Determination of Preferred Orientation,” J. Appl. Phys. 35, 1322–1328, 1964.Google Scholar
7. Tenckhoff, E., “Defocusing for the Schulz Technique of Determining Preferred Orientation,” J. Appl. Phys. 41, 3944–3948, 1970.Google Scholar
8. Norton, J. T., “A Technique for Quantitative Determination of Texture of Sheet Metals,” J. Appl. Phys. 19, 1176–1178, 1948.Google Scholar
9. Field, M. and Merchant, M. E., “Reflection Method of Determining Preferred Orientation on the Geiger Counter Spectrometer,” J. Appl. Phys. 20, 741–744, 1949.Google Scholar
10. Schulz, L. G., “A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-ray Spectrometer,” J. Appl. Phys. 20, 1030–1033, 1949.Google Scholar
11. Holland, J. R., Engler, N. and Powers, W., “The Use of Computer Techniques to Plot Pole Figures,” Mueller, W. M., Editor, Advances in X-ray Analysis, Vol. 4, 74–84, 1960.Google Scholar
12. BecK, P. A. and Hu, H., “The Origin of Recrystallization Texture,” ASM Seminar on Recrystallization, Grain Growth and Textures, October 1965, Cleveland, Ohio, 393–433.Google Scholar
13. Chao, Hung-Chi, “Direct Printout X-ray Pole Figures from Digital Computers,” Barrett, C. S., Newkirk, J. B. and Mallett, G. R., Editors, Advances in X-ray Analysis, Vol. 12, 391–403, 1968.Google Scholar