Skip to main content Accessibility help
×
Home

The Characterization of Large Single Crystals by High-Voltage X-Ray Laue Photographs

  • H. S. Peiser (a1) and E. P. Levine (a1)

Abstract

Large single crystals can be examined by conventional X-ray diffraction procedures only at their surface or by destructive sectioning. Within the limitations inherent in polychromatic X-ray photography, high-voltage Laue pictures arc shown to give some information on the internal quality of large crystals.

Asterism in conventional Laue photographs is contrasted, with streaks due to geometric effects in Laue patterns of large crystals. Detail within the streaks reveals subgrain structure. A primary extinction effect can be used as striking proof of good crystals being capable of scattering coherently over large distances.

Copyright

References

Hide All
1. Bacon, G. E., Neutron Diffraction, Clarendon Press, Oxford, 1962.
2. Henry, N. F. M., Lipson, H., and Wooster, W. A., The Interpretation of X-ray Diffraction Photographs, Macmillan and Co., London, 1960.
3. Peiser, H. S. and Rait, J. R., “A New Type of X-ray Diffraction Picture (High Voltage Laue Photographs),” Acta Cryst. 8: 738, 1955.
4. Rait, J. R. and Peiser, H. S., “The Potentialities of X-ray Diffraction Studies in Nondestructive Testing,” Brit. J. Appl. Phys., Suppl. 6: 13, 1957.
5. Van Bueren, H. G., Imperfection of Crystals, North-Holland Publishing Company, Amsterdam, 1960.

The Characterization of Large Single Crystals by High-Voltage X-Ray Laue Photographs

  • H. S. Peiser (a1) and E. P. Levine (a1)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed