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Calculated Patterns in X-Ray Powder Diffraction Analysis

Published online by Cambridge University Press:  06 March 2019

Gregory J. McCarthy
Affiliation:
Departments of Chemistry and Geology North Dakota State University Fargo, North Dakota 58105 USA
Kyli J. Martin
Affiliation:
Departments of Chemistry and Geology North Dakota State University Fargo, North Dakota 58105 USA
Jean M. Holzer
Affiliation:
Departments of Chemistry and Geology North Dakota State University Fargo, North Dakota 58105 USA
Dean G. Grier
Affiliation:
Departments of Chemistry and Geology North Dakota State University Fargo, North Dakota 58105 USA
Wayne M. Syvinski
Affiliation:
Departments of Chemistry and Geology North Dakota State University Fargo, North Dakota 58105 USA
Darred W. Nodland
Affiliation:
Departments of Chemistry and Geology North Dakota State University Fargo, North Dakota 58105 USA
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Abstract

Calculated patterns play an essential role in X-ray powder diffraction analysis. This paper gives examples of their use in qualitative analysis for evaluating and supplementing reference patterns in the ICDD Powder Diffraction File (PDF), in quantitative analysis for calculating Reference Intensity Ratios (RIRs), in ceil parameter refinements for indexing of low-symmetry/large unit cell diffractograms, in powder pattern determination for validating intensities and recognizing preferred orientation, in new materials synthesis for verification of structure type and phase purity, and for modeling the effects of solid solution substitution.

Type
I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns
Copyright
Copyright © International Centre for Diffraction Data 1991

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