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Background and Sensitivity Considerations of X-Ray Fluorescence Analysis with a Room-Temperature Mercuric Iodide Spectrometer*

Published online by Cambridge University Press:  06 March 2019

M. Singh ,
B.C. Clark ,
A.J. Dabrowski ,
J.S. Iwanczyk ,
D.E. Leyden  and
A.K. Baird
M. Singh
Affiliation:
University of Southern, California, Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, California
B.C. Clark
Affiliation:
University of Southern, California, Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, California Martin Marietta Aerospace, Denver, Colorado
A.J. Dabrowski
Affiliation:
University of Southern, California, Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, California
J.S. Iwanczyk
Affiliation:
University of Southern, California, Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, California
D.E. Leyden
Affiliation:
University of Southern, California, Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, California University of Denver, Denver, Colorado
A.K. Baird
Affiliation:
University of Southern, California, Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, California Pomona College, Claremont, California
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Extract

Continued development of mercuric iodide (HgI2) detectors for x-ray spectroscopy at room-temperature has led to a considerable improvement in energy resolution and a better understanding of the various detector parameters which affect sensitivity. The basic properties of a mercuric iodide detector and some of its characteristics pertinent to x-ray fluorescence analysis have been previously reported (1,2,3). In this paper we present results of studies to determine the shape o£ peaks and continuum background. Also, the use of Hgl2 in characterizing water pollutants by XRF analysis has been investigated and compared to cryogenically cooled Si(Li) and room-temperature proportional counter systems.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 337 - 343
Copyright
Copyright © International Centre for Diffraction Data 1980

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Footnotes

**

On leave from Institute of Nuclear Research, Swierk, Poland

*

Research supported by DOE Contract DE-AS03-76-SF00113 and NASA Contract NAS 1-15943

References

1. A.J. Dahrowaki, Huth, G.C., Singh, M., Ecotiomou, T.E., Turkevich, A.L., Appl. Phys. Lett. 33(2), 211–213 (1978)Google Scholar
2. Huth, G.C., Dabrowski, A.J., Singh, M., Economou, T.E., Turkevich, A.L., Adv. in X-Ray Analysis, 22, 461–472 (1979)Google Scholar
3. Singh, M., Dabrowski, A.J., Huth, G.C., Iwanczyk, J.S., Clark, B.C., Baird, A.K., Adv. in X-Ray Analysis, 23, 249–256 (1980)Google Scholar
4. Iwanczyk, J.S., Dabrowski, A.J., Wucl. Instrum. and Methods 134, 505-512, (1976)Google Scholar