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The Application of Digital Filters to the Analysis of Ge and Si(Li) Detector X-Ray Spectra
Published online by Cambridge University Press: 06 March 2019
Abstract
One of the uncertain aspects in the analysis of x-ray spectra is the determination of the proper background to subtract from the raw data. In those cases where the background is a smoothly varying funct ion of the x-ray energy, the application of a digital filter to the raw data will effectively remove the background leaving only the filtered peak information. These filtered peaks can then be fit by using a non-linear least squares method in conjunction with a suitably chosen mathematical model of the peak structure.
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- Mathematical Methods in XRF
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- Copyright © International Centre for Diffraction Data 1979