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Application of a Flatbed Transparency Scantier as an XRD Scanning Densitometer

  • J. P. Heuer (a1), J. P. Fernandez (a1), R. L. Lewis (a1) and C. G. Cleaver (a1)

Extract

The days of Debye-Scherrer film as a recording medium for X-ray powder patterns are all but gone with the development of precise, high sensitivity diffractometer systems. However, film does present some advantages over diffractometry (digital positioning and recording) for certain applications, A scanning densitometer system is described which totally automates the analysis of Debye-Scherrer film. It is much more precise and more capable than the simple line readers available in the past and can reduce the analysis time of complicated patterns from hours to minutes.

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1. Storms, H.A., X-ray Diffraction Analysis of Small Samples, Proceedings of the 9th Pacific Conference on Applied Spectroscopy, October 6-9 1970.
2. DataScan is available from Materials Data Inc., P. O. Box 791, Livermore, CA 94551-0791.
3. JADE is available from Materials Data Inc., P. O. Box 791, Livermore, CA 94551-0791.
4. JCPDS-ICDD, 1601 Park Lane, Swarthmore, PA 19081.

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