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An Electro-Optical X-Ray Diffraction System for Grain Boundary Migration Measurements at Temperature

Published online by Cambridge University Press:  06 March 2019

Robert E. Green Jr.
Robert E. Green Jr.*
Affiliation:
The Johns Hopkins University Baltimore, Maryland 21218
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Abstract

Considerable work has been undertaken in order to gain an understanding of the mechanisms responsible for the generation of recrystallization textures developed upon annealing of cold-worked metals. Most direct measurements have consisted of measuring the increase in average diameter of the largest grain growing into a polycrystalline aggregate. Experimental measurements of individual boundaries migrating into deformed single crystals, though of a more fundamental nature, have been made by far fewer investigators. This is probably due to the increased experimental difficulties associated with careful control of such experiments. Most previous investigators have made grain boundary migration measurements by the heat-cool-etch method, despite the fact that it has several marked disadvantages. Other investigators have constructed an X-ray goniometer furnace and used it to measure grain boundary migration rates while the test specimen was maintained at temperature. Since there have been no published reports of the use of such a system in the past thirteen years, it must be concluded that the technique was unsuccessful in general.

The system described in the present work is relatively simple in design and extremely simple to use. Not only does it permit absolute measurement of grain boundary position at temperature but it also permits boundary migration measurements to be made of extremely fast moving boundaries. The basic components of the system are as follows. A continuous spectrum X-ray beam is converted by a slit collimating system into a beam which is incident along the entire length of the test specimen. This beam is interrupted by a wire grid just prior to impingement on the test specimen. The test specimen is supported vertically in a furnace maintained at the temperature required for grain boundary migration. The various diffracted X-ray beams pass out of the furnace through a highly reflecting insulating baffle made from very thin aluminum foil and impinge on a fluorescent screen. This screen converts the X-ray image into a visible one which is amplified and recorded using the electro-optical system.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 435 - 445
Copyright
Copyright © International Centre for Diffraction Data 1971

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References

1. Beck, P. A., “Notes on the Theory of Annealing Textures,” Acta Met. 1, 231–234 (1953).Google Scholar
2. Beck, P. A., “Annealing of Cold Worked Metals,” Adv. in Phys. 3, 245–324 (1954).Google Scholar
3. Burgers, W. G. and Tiedema, T. J., “Notes on the Theory of Annealing Textures: Comments on a paper by P. A. Beck with the same title,” Acta Met. 1, 234–238 (1953).Google Scholar
4. Weinberg, F., “Grain Boundaries in Metals,” Prog. Met. Phys. 8, 105–146 (1959).Google Scholar
5. Lucke, K., “Korngrenzenstruktur und Rekristallisation,” Z. MetalIkde. 52, 1–12 (1961).Google Scholar
6. Beck, P. A., “Die Bewegung von Grosswinkelkorngrenzen bei Rekristallisation,” Z. Metallkde. 52, 13–19 (1961).Google Scholar
7. Burgers, W. G., “Prozesse der Keimbildung bei der Rekristallisation,” Z. Metal1kde. 52, 19–26 (1961).Google Scholar
8. Detert, K., “Die Deutung Technischer Rekristallisation,” Z. Metal1kde. 52, 27–34 (1961).Google Scholar
9. Stuwe, H. P., “Texturbildung bei der Primarrekristallisation,” Z. Metal1kde. 52, 34–44 (1961).Google Scholar
10. Dehlinger, U., “Zur Theorie der Rekristallisation,” Z. Metal1kde. 52, 44–47 (1961).Google Scholar
11. Aust, K. T. and Rutter, J. W., “Some Annealing Phenomena in Hiqh-Purity Metals,” in Ultra-High-Purity Metals, Metals Park, Ohio (1962).Google Scholar
12. Himmel, L., Recovery and Recrystallization of Metals, Interscience Publishers (1963).Google Scholar
13. Byrne, J. G., Recovery, Recrystal1ization, and Grain Growth, The Macmillan Co. (1965).Google Scholar
14. Recrystallization, Grain Growth and Textures, American Society for Metals, Metals Park, Ohio (1966).Google Scholar
15. Graham, C. D. Jr., and Cahn, R. W., “Measurement of Grain Growth Rates in Recrystallization,” Trans, Met. Soc. AIME 206, 504–508 (1956).Google Scholar
16. Graham, C. D. Jr., and Cahn, R. W., “Grain Growth Rates and Orientation Relationships in the Recrystallization of Aluminum Single Crystals,” Trans. Met. Soc. AIME 206, 517–521 (1956).Google Scholar
17. Leighly, H. P. Jr., McCune, R. A., and Perkins, F. C., “Research on the Recrystallization of Aluminum Single Crystals,” Denver Research Institute, University of Denver, WADC Technical Report 58-634, ASTIA No. AD 212562 (1958).Google Scholar
18. Reifsnider, K. and Green, R. E. Jr., “An Image Intensifier System for Dynamic X-ray Diffraction Studies,” Rev. Sci. Instr. 39, 1651–1655 (1968).Google Scholar
19. Reifsnider, K. and Green, R. E. Jr., “Dynamic X-ray Diffraction Study of the Deformation of Aluminum Crystals,” Trans. Met. Soc. AIME 245, 1615–1619 (1969).Google Scholar
20. Green, R. E. Jr., “Electro-Optical Systems for Dynamic Recording of X-ray Diffraction Images,” in Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-ray Analysis, Vol. 14, p. 311–337, Plenum Press (1971).Google Scholar
21. Reifsnider, K. and Green, R. E. Jr., “ X-ray Diffraction Macroscopic Study of Deformed Aluminum Crystals,” Trans. Met. Soc. AIME 233, 932–936 (1965).Google Scholar
22. Green, R. E. Jr., Yoshida, H., and Liebmann, B. G., “Investigations on Recrystallization and Recovery of Strained Aluminum Single Crystals,” Metals Res. Lab. Brown Univ. Tech. Note TN 59-381 AFOSR ASTIA No. AD 214 008 (1959).Google Scholar
23. Green, R. E. Jr., Liebmann, B. G., and Yoshida, H., “Influence of Thermal History on Preferred Orientations in the Recrystallization of Technically Pure Aluminum,” Trans. Met. Soc. AIME 215, 610–613 (1959).Google Scholar
24. Green, R. E. Jr., “Some Factors Influencing Grain Boundary Migration in Aluminum,” Trans. Met. Soc. AIME 233, 1954–1960 (1965).Google Scholar
25. Yoshida, H., Liebmann, B., and Lücke, K., “Orientation of Recrystallized Grains in Strained Aluminum Single Crystals,” Acta Met. 7, 51–56 (1959).Google Scholar