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Accurate PIXE Analysis of Thin Samples, Aerosol Loaded Filters and Surface Layers of Thick Samples*

Published online by Cambridge University Press:  06 March 2019

U. Wätjen  and
F.-W. Richter
U. Wätjen
Affiliation:
Fachbereich Physik, Universität Marburg D-3550 Marburg, Fed. Rep. of Germany
F.-W. Richter
Affiliation:
Fachbereich Physik, Universität Marburg D-3550 Marburg, Fed. Rep. of Germany
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Extract

Particle induced X-ray emission (PIXE) analysis is well established as a multi-element, non-destructive technique to measure the trace element content of thin samples (≤ 1 mg/cm2). The wide range of its analytical applications was shown in numerous reports at the 2nd International PIXE Conference in Lund. For thin sample analysis routinely done at the Marburg PIXE facility, we calibrated our spectrometer empirically at proton energies of 2 and 4 MeV using two separate sets of calibration standards, one purchased from MicroMatter Co., the other prepared by precipitate exchange. Both sets of standards were checked by AAS and CMP. K-shell ionization cross sections, calculated from our measured x-ray yields, agree very well with recent literature values, and will be reported elsewhere.

Type
V. XRF Environmental Applications
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 195 - 199
Copyright
Copyright © International Centre for Diffraction Data 1981

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Footnotes

*

Supported by Bundesminister fur Forschung und Technologie, Bonn

References

1. Johansson, S. A. E., ed., “Particle induced x-ray emission and its analytical applications”, Proc. 2nd Int. Conf., Lund, Sweden, 1980, Nucl. Instr. and Meth. 181, 1–546 (1981).Google Scholar
2. Hasselmann, I., Koenig, W., Richter, F.W., Steiner, U., Watjen, U., Bode, J.C., and Ohta, W., Nucl. Instr. and Meth. 142, 163-170 (1977); Koenig, W., Richter, F.W., Steiner, U., Stock, R., Thielmann, R. and Watjen, U., Nucl. Instr. and Meth. 142, 225-229 (1977).Google Scholar
3. Disam, A., Tschopel, P. and Tolg, G., Fresenius Z. Anal. Chem. 295, 97–109 (1979).Google Scholar
4. Proc. Workshop on theories of inner shell ionization by heavy particles, Nucl. Instr. and Meth. 169, 249–317 (1980).Google Scholar
5. Richter, F.-W. and WStjen, U., Nucl. Instr. and Meth. 181, 189–194 (1981).Google Scholar
6. Seiler, H., Haas, U., Rentschler, I., Schreiber, H., Wieser, P. and Wurster, R., Optik 58, 145–157 (.1981).Google Scholar