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Accurate Measurement of Lattice Misfit Between γ And γ' Phases in Nickel-Base Superalloys at High Temperatures

Published online by Cambridge University Press:  06 March 2019

Tadaharu Yokokawa ,
Katsumi Ohno ,
Hideyuki Murakami ,
Toshiharu Kobayashi ,
Toshihiro Yamagata  and
Hiroshi Harada
Tadaharu Yokokawa
Affiliation:
National Research Institute for Metals 1-2-1 Sengen, Tsukuba City, Ibaraki 305, Japan
Katsumi Ohno
Affiliation:
National Research Institute for Metals 1-2-1 Sengen, Tsukuba City, Ibaraki 305, Japan
Hideyuki Murakami
Affiliation:
National Research Institute for Metals 1-2-1 Sengen, Tsukuba City, Ibaraki 305, Japan
Toshiharu Kobayashi
Affiliation:
National Research Institute for Metals 1-2-1 Sengen, Tsukuba City, Ibaraki 305, Japan
Toshihiro Yamagata
Affiliation:
National Research Institute for Metals 1-2-1 Sengen, Tsukuba City, Ibaraki 305, Japan
Hiroshi Harada
Affiliation:
National Research Institute for Metals 1-2-1 Sengen, Tsukuba City, Ibaraki 305, Japan
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Abstract

Accurate measurement of the lattice misfit between the γ and γ phases in Ni-base single crystal superalloys at high temperatures has successfully been achieved using a parallel beam mode X-ray diffractometer with a high temperature specimen stage. The superalloys have γ' precipitates, an ordered FCC structure based on Ni3Al, in a γ-matrix having a disordered FCC structure (LI2). The parallel beam mode, the optics of which is made from a Ge (111) channel cut crystal, generates a superior monochromatic and parallel CuKα1 beam, which makes it possible to resolve a cluster peak in Ni-base superalloys into individual γ and γ ‘ peaks. This peak separation was almost impossible using the CuKα1+2 doublet beam from the standard type para-focusing mode, due to the very small difference in lattice parameters between the two phases.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 449 - 456
Copyright
Copyright © International Centre for Diffraction Data 1995

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References

1) Harada, H., Ohno, K., Yamagata, T., Yokokawa, T. and Yamazaki, M., Proc. of “SuperaUoys”, p. 733 (1988), held in Seven Springs, A, U. S..Google Scholar
2) Yokokawa, T., Ohno, K., Harada, H., Nakazawa, S., Yamagata, T. and Yamazaki, M., Proc. of “Creep and Fracture of Engineering Materials and Structure”, p. 245 (1993), held in Swansea U.K.Google Scholar
3) Harada, H., Ohno, K., Yokokawa, T. and Yamazaki, M., Proc. of “SuperaUoys”, p. 305 (1988), held in Seven Springs, U. S. A.Google Scholar
4) Ohno, K., Ohsumi, K., Harada, H., Yamagata, T. and Yamazaki, M., Adv. X-ray Anal., 34, p. 493 (1991).Google Scholar
5) Ohno, K., Yokokawa, T. and Yamagata, T., Adv. X-ray Anal., 36, p. 515 (1993).Google Scholar
6) Parrish, W., Huang, T. C., Ayers, G. L., Trans. Am. Cryst Assc., , 12, p. 55 (1976).Google Scholar
7) Toraya, H., Marumo, F., Report of Res. Lab. Eng. Mat., Tokyo Inst, of tech., 5, p. 55 (1980).Google Scholar