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Sample Treatment for TXRF - Requirements and Prospects

Published online by Cambridge University Press:  06 March 2019

Andreas Prange  and
Heinrich Schwenke
Andreas Prange
Affiliation:
Institut für Physik, GKSS-Forsehungszentrum Geesthacht GmbH P.O.Box 1160, 0-2054 Geesthacht, Federal Republic of Germany
Heinrich Schwenke
Affiliation:
Institut für Physik, GKSS-Forsehungszentrum Geesthacht GmbH P.O.Box 1160, 0-2054 Geesthacht, Federal Republic of Germany
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Extract

Total-reflection X-ray fluorescence spectrometry, abbreviated as TXRF, is known for its high sensitivity down to the low pg-level or sub-ppb level, respectively, and its wide dynamic range of about three to four orders of magnitude (Yoneda and Horiuchi, 1971, Wobrauschek and Aiginger, 1980; Knoth and Schwenke, 1978 and 1980, Aiginger and Wobrausohek, 1985, Michaelis et al., 1985, Prange, 1987). Meanwhile several laboratories have purchased commercially available TXRF spectrometers and have started to report favourable about this technique. Applications have been reported from various disciplines: These are estuarine and marine water quality management and research, air pollution studies, mineralogical investigations, biology and medicine (Prange, 1987, Prange et al, 1985; Prange and Kremling, 1985, Prange et al., 1987, Stöβel and Prange, 1985, Michaelis, 1986, Ketelsen and Knöchel, 1985, Leland et al., 1987, von Bohlen et al., 1987, Junge et al., 1983, Hentschke et al., 1985, Hentschke et al., 1985, Gerwinski and Goetz, 1987, von Bohlen et al., 1987), In spite of its close kinship to conventional EDXRF , TXRF is quite different with respect to operation and performance and provides complementary capabilities.

Type
V. XRF Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 211 - 220
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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